The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)
Scope
SISS-12 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a post-conference of SIMS-XVII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.
The location of SISS-13 has been changed to Toyota Central R&D Labs., Inc., in Nagoya area. The new place is located 400 km west of Tokyo and is near to an international airport called Centrair airport which has direct airlines to many places including Detroit, Frankfurt, Helsinki, Hong Kong, Beijing, Seoul and Pusan.
Date
June 10-11, 2010 10:00-17:00
Place
Meeting Room on the 4th floor, University Building #14,
Seikei University (Social meeting: June 10, 2010 17:20-19:00, Hall on the 12th floor, University Building #10)
Fee
5,000 Yen (including social meeting fee)
Program（Download）
Guideline for presenter
All invited and contributed presenters are expected to write abstract paper. Digital file (MS-Word file) should be sent by e-mail to the committee, no later than May 21th, 2010. The abstract should be accompanied by a cover letter stating the title, name, address, e-mail address. The format requires A4 page (No page limitation).
Committee
Organizing Committee
Chair: Masahiro Kudo（Seikei University)
Syunichi Hayashi (Nippon Steel)
Program Coordinators
Akio Takano (NTT-AT)
Atsushi Murase (Toyota Central R&D Labs.)
Masashi Nojima (Tokyo University of Science)
Mitsuhiro Tomita (Toshiba)
Nobuhiko Kato (Seikei University)
Satoka Aoyagi (Shimane University)
Teiichiro Kono (Asahi Kasei)
Manabu Komatsu (Canon)